Research Title |
Research Type |
Research Year |
Spectroscopic ellipsometry and electrical characterizations of InGaAs:Mg thin films lattice matched to InP Spectroscopic ellipsometry and electrical characterizations of InGaAs:Mg thin films lattice matched to InP
SPRINGER HEIDELBERG, TIERGARTENSTRASSE 17, D-69121 HEIDELBERG, GERMANY |
Article In Journal |
1437 |
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